The application of semiconductor discrete device reliability testing equipment

1. IntroductionSemiconductor discrete device reliability testing equipment comprises specialized tools and systems designed to evaluate the reliability and stability of semiconductor discrete devices under various conditions. These devices simulate environmental and electrical stress scenarios that components may encounter during actual operation, conducting a series of tests and monitoring to det

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Application Case of Silicon Carbide Crystal Growth Furnace in the Semiconductor Industry

Physical Vapor Transport (PVT) is one of the mainstream methods for preparing silicon carbide (SiC) crystals. In PVT-based SiC single crystal growth, temperatures can reach up to 2300°C, requiring strict control of the temperature gradient during the process. The temperature control system employs a closed-loop design, consisting of an infrared pyrometer, a temperature controller, a heating power

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Industry Case | YUDIAN Multi-Loop Temperature Controllers Excel in Quality, Addressing Diverse Testing Demands in Semiconductor Manufacturing

As the semiconductor industry enters the era of chip integration, the increasing complexity of processes and applications makes a "testing-first" approach critical for high-quality production. Testing equipment, used to detect chip performance and defects during semiconductor manufacturing, is required after nearly every process stage. High-precision temperature control remains pivotal throughout

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